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The MPR E-Scan is a microprocessor driven critical angle refractometer. It is used to measure the refractive index of process fluids and may be used as an error indicator or part of a complete process control system. The latest in microprocessor driven critical angle process refractometers, the MPR E-Scan can be inserted directly into the process line or vessel for measurement and control. The refractometer can read out directly in R.I., Brix, SGU, Percent Solids, DS, etc. Cost reduction and high quality products are the direct benefits of its use on your process. |
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Sample of Applications
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Features
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OPTIONS
Built-in PID Controller, Intrinsically Safe, Dual Sensor Capability
SPECIFICATIONS
| ACCURACY | +/- 1% of span or .000075 R.I., whichever is greater |
| SPAN | .0015
R.I. Minimum 1 BRIX
.132 R.I. Maximum 70 BRIX |
| REPEATABILITY | .5 % o f span or better |
| SENSITIVITY | .5 % o f span or better |
| RESPONSE
TIME:
Console Head |
250 M.S. to 3 Min. <500 M.S. for .0015 R.I. Change with 90% recovery on .015 R.I. span |
| PROCESS TEMP. | Up to 300° F (150°C) |
| AMBIENT TEMP. | Up to 125° F (52°C), Console 32°F to 120°F (0°C to 50°C) |
| PROCESSOR | INTEL 386SX, 25 MHz |
| INTERCONNECTING CABLE | 20' 6M Standard, 500' 152M Maximum |
| SENSING
HEAD:
Wetted Material of Construction |
316 S/S, Sapphire, TEFLONŽ, VITONŽ (other alloys & elastomers available), NEMA 4X |
| OUTPUTS | 4-20MA non-isolated, 0-10 VDC non-isolated Optional: 4-20 MA isolated or 0-20MA isolated |
| POWER REQUIREMENTS | 11/220 VAC, 50/60 HZ, 50 VA |
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The Electron Machine Corporation Ph: 352-669-3101 Fax: 352-669-1373 |